Satoshi Gonda: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Profile surface roughness measurement using metrological atomic force microscope and uncertainty evaluation

Misumi, Ichiko, Naoi, Kazuya, Sugawara, Kentaro, Gonda, Satoshi

Journal:

Year:

2015

Language:

english

File:

PDF, 1.23 MB

english, 2015

2

Development of a metrological atomic force microscope with a tip-tilting mechanism for three-dimensional nanometrology

Kizu, Ryosuke, Misumi, Ichiko, Hirai, Akiko, Kinoshita, Kazuto, Gonda, Satoshi

Journal:

Measurement Science and Technology

Year:

2018

Language:

english

File:

PDF, 7.53 MB

english, 2018

3

A reference-scan-based method for correcting the nonlinear drift of atomic force microscopy at sub-nanometer precision

Kizu, Ryosuke, Misumi, Ichiko, Hirai, Akiko, Gonda, Satoshi

Journal:

Measurement Science and Technology

Year:

2020

Language:

english

File:

PDF, 1.95 MB

english, 2020

4

Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement

Qiangxian Huang, Satoshi Gonda, Ichiko Misumi, Osamu Sato, Taeho Keem, Tomizo Kurosawa

Journal:

Sensors and Actuators A: Physical

Year:

2006

Language:

english

File:

PDF, 657 KB

english, 2006

5

Simple, real-time method for removing the cyclic error of a homodyne interferometer with a quadrature detector system

Keem, Taeho, Gonda, Satoshi, Misumi, Ichiko, Huang, Qianxiang, Kurosawa, Tomizo

Journal:

Year:

2005

Language:

english

File:

PDF, 1.09 MB

english, 2005

6

Critical-Dimension Measurement using Multi-Angle-Scanning Method in Atomic Force Microscope

Murayama, Ken, Gonda, Satoshi, Koyanagi, Hajime, Terasawa, Tsuneo, Hosaka, Sumio

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 366 KB

english, 2006

7

Uncertainty in pitch measurements of one-dimensional grating standards using a nanometrological atomic force microscope

Misumi, Ichiko, Gonda, Satoshi, Kurosawa, Tomizo, Takamasu, Kiyoshi

Journal:

Measurement Science and Technology

Year:

2003

Language:

english

File:

PDF, 1.62 MB

english, 2003

8

SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic technology, and Artificial Intelligence - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence - Pitch calibration of one-dimensional grating standard by tapping mode nanometrological atomic force microscope

Huang, Qiangxian, Fang, Jiancheng, Wang, Zhongyu, Misumi, Ichiko, Gonda, Satoshi, Sato, Osamu, Kurosawa, Tomizo

Year:

2006

Language:

english

File:

PDF, 361 KB

english, 2006

9

Preparation of SrCuOy film in ultra-high vacuum system

Tadashi Tsukahara, Mamoru Yoshimoto, Hirotoshi Nagata, Takuya Hashimoto, Satoshi Gonda, Hideomi Koinuma

Journal:

Solid State Ionics

Year:

1991

Language:

english

File:

PDF, 263 KB

english, 1991

10

In situ surface analysis of SrCuO2 heteroepitaxy on SrTiO3 substrate using X-ray photoelectron spectroscopy

Satoshi Gonda, Hirotoshi Nagata, Masashi Kawasaki, Mamoru Yoshimoto, Hideomi Koinuma

Journal:

Physica C: Superconductivity

Year:

1993

Language:

english

File:

PDF, 486 KB

english, 1993

11

Reliability of parameters of associated base straight line in step height samples: Uncertainty evaluation in step height measurements using nanometrological AFM

Ichiko Misumi, Satoshi Gonda, Tomizo Kurosawa, Yasushi Azuma, Toshiyuki Fujimoto, Isao Kojima, Toshihisa Sakurai, Tadahiro Ohmi, Kiyoshi Takamasu

Journal:

Precision Engineering

Year:

2006

Language:

english

File:

PDF, 485 KB

english, 2006

12

IFATS Collection: Fibroblast Growth Factor-2-Induced Hepatocyte Growth Factor Secretion by Adipose-Derived Stromal Cells Inhibits Postinjury Fibrogenesis Through a c-Jun N-Terminal Kinase-Dependent Mechanism

Hirotaka Suga, Hitomi Eto, Tomokuni Shigeura, Keita Inoue, Noriyuki Aoi, Harunosuke Kato, Satoshi Nishimura, Ichiro Manabe, Koichi Gonda, Kotaro Yoshimura

Journal:

Year:

2009

Language:

english

File:

PDF, 1.35 MB

english, 2009

13

Removing Nonlinearity of a Homodyne Interferometer by Adjusting the Gains of its Quadrature Detector Systems

Keem, Taeho, Gonda, Satoshi, Misumi, Ichiko, Huang, Qiangxian, Kurosawa, Tomizo

Journal:

Year:

2004

Language:

english

File:

PDF, 144 KB

english, 2004

14

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Extension of gravity center method for diameter calibration of polystyrene standard particles with a metrological AFM

Misumi, Ichiko, Takahata, Keiji, Sugawara, Kentaro, Gonda, Satoshi, Ehara, Kensei

Year:

2012

Language:

english

File:

PDF, 807 KB

english, 2012

15

The interference effect in an optical beam deflection detection system of a dynamic mode AFM

Huang, Qiang-Xian, Fei, Ye-Tai, Gonda, Satoshi, Misumi, Ichiko, Sato, Osamu, Keem, Taeho, Kurosawa, Tomizo

Journal:

Measurement Science and Technology

Year:

2006

Language:

english

File:

PDF, 493 KB

english, 2006

16

Submicrometre-pitch intercomparison between optical diffraction, scanning electron microscope and atomic force microscope

Misumi, Ichiko, Gonda, Satoshi, Kurosawa, Tomizo, Tanimura, Yoshihisa, Ochiai, Naofumi, Kitta, Jun-ichiro, Kubota, Fumio, Yamada, Mitsuhiko, Fujiwara, Yoshinobu, Nakayama, Yoshinori, Takamasu, Kiyoshi

Journal:

Measurement Science and Technology

Year:

2003

Language:

english

File:

PDF, 243 KB

english, 2003

17

Peripheral blood progenitor cell collection by two programs for autologous and allogeneic transplantation

Ikeda, Kazuhiko, Ohto, Hitoshi, Kanno, Takahiro, Gonda, Kenji, Suzuki, Yuhko, Ono, Takako, Saito, Shunnichi, Takahashi, Hiroshi, Kimura, Satoshi, Harada-Shirado, Kayo, Yamauchi, Hiroyuki, Hoshino, Yas

Journal:

Transfusion (Elsevier)

Year:

2014

Language:

english

File:

PDF, 292 KB

english, 2014

18

Heteroepitaxial Growth of CeO 2 (001) Films on Si(001) Substrates by Pulsed Laser Deposition in Ultrahigh Vacuum

Nagata, Hirotoshi, Tsukahara, Tadashi, Gonda, Satoshi, Yoshimoto, Mamoru, Koinuma, Hideomi

Journal:

Japanese Journal of Applied Physics

Year:

1991

Language:

english

File:

PDF, 250 KB

english, 1991

19

Sub-hundred nanometre pitch measurements using an AFM with differential laser interferometers for designing usable lateral scales

Misumi, Ichiko, Gonda, Satoshi, Huang, Qiangxian, Keem, Taeho, Kurosawa, Tomizo, Fujii, Akihiro, Hisata, Nahoko, Yamagishi, Takeshi, Fujimoto, Hirohisa, Enjoji, Ken, Aya, Sunao, Sumitani, Hiroaki

Journal:

Measurement Science and Technology

Year:

2005

Language:

english

File:

PDF, 854 KB

english, 2005

20

25 nm pitch comparison between a traceable x-ray diffractometer and a metrological atomic force microscope

Misumi, Ichiko, Kitta, Jun-ichiro, Fujimoto, Hiroyuki, Gonda, Satoshi, Azuma, Yasushi, Maeda, Keisuke, Kurosawa, Tomizo, Ito, Yoshiyasu, Omote, Kazuhiko, Nakayama, Yoshinori, Kawada, Hiroki

Journal:

Measurement Science and Technology

Year:

2012

Language:

english

File:

PDF, 1.30 MB

english, 2012

21

Accurate measurement of orthogonality of equal-period, two-dimensional gratings by an interferometric method

Feng, Can, Kajima, Mariko, Gonda, Satoshi, Minoshima, Kaoru, Fujimoto, Hiroyuki, Zeng, Lijiang

Journal:

Year:

2012

Language:

english

File:

PDF, 2.00 MB

english, 2012

22

Bilateral comparison of 25 nm pitch nanometric lateral scales for metrological scanning probe microscopes

Misumi, Ichiko, Dai, Gaoliang, Lu, Mingzi, Sato, Osamu, Sugawara, Kentaro, Gonda, Satoshi, Takatsuji, Toshiyuki, Danzebrink, Hans-Ulrich, Koenders, Ludger

Journal:

Measurement Science and Technology

Year:

2010

Language:

english

File:

PDF, 243 KB

english, 2010

23

SPIE Proceedings [SPIE International Conference on Optical Particle Characterization (OPC 2014) - Tokyo, Japan (Monday 10 March 2014)] International Conference on Optical Particle Characterization (OPC 2014) - Recent activity of international comparison for nanoparticle size measurement

Aya, Nobuhiro, Iki, Norihiko, Shimura, Tsutomu, Shirai, Tomohiro, Takahashi, Kayori, Takahata, Keiji, Misumi, Ichiko, Sugawara, Kentaro, Gonda, Satoshi, Ehara, Kensei

Year:

2014

Language:

english

File:

PDF, 310 KB

english, 2014

24

Height Measurement Using High-Precision Atomic Force Microscope Scanner Combined with Laser Interferometers

Murayama, Ken, Gonda, Satoshi, Kinoshita, K., Koyanagi, Hajime, Terasawa, Tsuneo, Hosaka, Sumio

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 417 KB

english, 2006

25

[AIP CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY 2005 - Richardson, Texas (USA) (15-18 March 2005)] AIP Conference Proceedings - Ultraprecision CD Metrology for Sub-100 nm Patterns by AFM

Year:

2005

Language:

english

File:

PDF, 1.13 MB

english, 2005

26

Fluorine Doping and Superconductivity of Nd 2 CuO 4 Thin Films

Koinuma, Hideomi, Takeuchi, Kou, Yoshimoto, Mamoru, Hashida, Kenji, Nakabayashi, Masaaki, Gonda, Satoshi, Hirayama, Tohru, Shiraishi, Tadashi

Journal:

Japanese Journal of Applied Physics

Year:

1990

Language:

english

File:

PDF, 248 KB

english, 1990

27

Side-Wall Measurement using Tilt-Scanning Method in Atomic Force Microscope

Murayama, Ken, Gonda, Satoshi, Koyanagi, Hajime, Terasawa, Tsuneo, Hosaka, Sumio

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 311 KB

english, 2006

28

Sub-Nanometer Scale Measurements of Silicon Oxide Thickness by Spectroscopic Ellipsometry

Gonda, Satoshi, Tanaka, Mitsuru, Kurosawa, Tomizo, Kojima, Isao

Journal:

Japanese Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 180 KB

english, 1998

29

SPIE Proceedings [SPIE International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Singapore, Singapore (Tuesday 9 April 2013)] International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Pixel length calibration using a pattern matching method for secondary-electron images

Sugawara, Kentaro, Quan, Chenggen, Qian, Kemao, Misumi, Ichiko, Gonda, Satoshi, Asundi, Anand

Year:

2013

Language:

english

File:

PDF, 891 KB

english, 2013

30

Novel Process for Ceramic Epitaxy Using Laser Mbe

Yoshimoto, Mamoru, Nagata, Hirotoshi, Tsukahara, Tadashi, Gonda, Satoshi, Koinuma, Hideomi

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 1.41 MB

english, 1990

31

Growth Mechanism of Epitaxial Oxide Films by Laser MBE

Nagata, Hirotoshi, Yoshimoto, Mamoru, Tsukahara, Tadashi, Gonda, Satoshi, Koinuma, Hideomi

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 1.02 MB

english, 1990

32

SPIE Proceedings [SPIE Photonics West '96 - San Jose, CA (Saturday 27 January 1996)] Spectroscopic Studies of Superconductors - High-resolution photoelectron yield spectroscopy of oxide superconductors

Kawasaki, Masashi, Ohashi, Satoru, Kitajima, Toshikazu, Gonda, Satoshi, Kanda, Noriyoshi, Tsuchiya, Ryuta, Kishio, Kohji, Koinuma, Hideomi, Bozovic, Ivan, van der Marel, Dirk

Year:

1996

Language:

english

File:

PDF, 584 KB

english, 1996

33

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Three-dimensional metrology with side-wall measurement using tilt-scanning operation in digital probing AFM

Murayama, Ken, Archie, Chas N., Gonda, Satoshi, Koyanagi, Hajime, Terasawa, Tsuneo

Year:

2006

Language:

english

File:

PDF, 483 KB

english, 2006

34

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - AFM measurement of linewidth with sub-nanometer scale precision

Gonda, Satoshi, Silver, Richard M., Kinoshita, Kazuto, Noguchi, Hironori, Kurosawa, Tomizo, Koyanagi, Hajime, Murayama, Ken, Terasawa, Tsuneo

Year:

2005

Language:

english

File:

PDF, 1.25 MB

english, 2005

35

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Development of photomask linewidth measurement and calibration using AFM and SEM in NMIJ

Sugawara, Kentaro, Postek, Michael T., Newbury, Dale E., Sato, Osamu, Misumi, Ichiko, Platek, S. Frank, Joy, David C., Gonda, Satoshi, Lu, Mingzi, Maugel, Tim K.

Year:

2011

Language:

english

File:

PDF, 931 KB

english, 2011

36

SPIE Proceedings [SPIE Third International Symposium on Precision Mechanical Measurements - Urumqi, China (Wednesday 2 August 2006)] Third International Symposium on Precision Mechanical Measurements - Research on pitch analysis methods for calibration of one-dimensional grating standard based on nanometrological AFM

Huang, Qiangxian, Gonda, Satoshi, Misumi, Ichiko, Keem, Taeho, Kurosawa, Tomizo

Year:

2006

Language:

english

File:

PDF, 528 KB

english, 2006

37

Revascularization of the anterior cerebral artery

Ikeda, Akira, Okada, Tomohisa, Shibuya, Masato, Noda, Satoshi, Sugiura, Masakazu, Iguchi, Ikuzo, Gonda, Takami, Kageyama, Naoki

Journal:

Journal of Neurosurgery

Year:

1985

Language:

english

File:

PDF, 1.37 MB

english, 1985

38

Abnormality of Auricular Muscles in Congenital Auricular Deformities

Yotsuyanagi, Takatoshi, Yamauchi, Makoto, Yamashita, Ken, Sugai, Asuka, Gonda, Ayako, Kitada, Ayaka, Saito, Tamotsu, Urushidate, Satoshi

Journal:

Plastic & Reconstructive Surgery

Year:

2015

Language:

english

File:

PDF, 1.40 MB

english, 2015

39

SPIE Proceedings [SPIE Workshop on Nanostructure Science, Metrology, and Technology - Gaithersburg, MD (Wednesday 5 September 2001)] Nanostructure Science, Metrology, and Technology - New design and uncertainty budget for a metrology UHV-STM used in direct measurements of atom spacings

Gonda, Satoshi, Zhou, Hui, Fu, Joseph, Silver, Richard M., Peckerar, Martin C., Postek, Jr., Michael T.

Year:

2002

Language:

english

File:

PDF, 85 KB

english, 2002

40

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - Novel CD-SEM calibration reference patterned by EB cell projection lithography

Nakayama, Yoshinori, Silver, Richard M., Gonda, Satoshi, Misumi, Ichiko, Kurosawa, Tomizo, Kitta, Jun-ichiro, Mine, Hisaichi, Sasada, Katsuhiro, Yoneda, Shozo, Mizuno, Takeshi

Year:

2005

Language:

english

File:

PDF, 1.06 MB

english, 2005

41

Association between circulating galectin‑3 levels and the immunological, inflammatory and nutritional parameters in patients with colorectal cancer

Shimura, Tatsuo, Shibata, Masahiko, Gonda, Kenji, Nakajima, Takahiro, Chida, Shun, Noda, Masaru, Suzuki, Satoshi, Nakamura, Izumi, Ohki, Shinji, Takenoshita, Seiichi

Journal:

Biomedical Reports

Year:

2016

Language:

english

File:

PDF, 421 KB

english, 2016

42

Serotype and Drug Susceptibility of Bordetella pertussis and Bordetella parapertussis isolated from 1975 to 1985 in Japan

WATANABE, Mitsuru, HARAGUCHI, Yoshiko, GONDA, Takaaki, AOYAMA, Tatsuo, OZAWA, Hiroko, MURASE, Yuji, IWATA, Takashi, IWATA, Satoshi, KUSANO, Shoichi

Journal:

Kansenshogaku zasshi

Year:

1987

File:

PDF, 837 KB

1987

43

Effect of Antigravity-Suction-Casting Parameters on Microstructure and Mechanical Properties of Mg–10Al–0.2Mn–1Ca Cast Alloy

Ito, Tomomi, Noda, Masafumi, Mori, Hisashi, Gonda, Yoshio, Fukuda, Yuta, Yanagihara, Satoshi

Journal:

MATERIALS TRANSACTIONS

Year:

2014

Language:

english

File:

PDF, 3.56 MB

english, 2014

44

Nanometer Scale Height Standard Using Atomically Controlled Diamond Surface

Tokuda, Norio, Umezawa, Hitoshi, Kato, Hiromitsu, Ogura, Masahiko, Gonda, Satoshi, Yamabe, Kikuo, Okushi, Hideyo, Yamasaki, Satoshi

Journal:

Applied Physics Express

Year:

2009

Language:

english

File:

PDF, 1.66 MB

english, 2009

45

Periodic error evaluation system for linear encoders using a homodyne laser interferometer with 10 picometer uncertainty

Hori, Yasuaki, Gonda, Satoshi, Bitou, Youichi, Watanabe, Akihiro, Nakamura, Koutaro

Journal:

Precision Engineering

Year:

2017

Language:

english

File:

PDF, 790 KB

english, 2017

46

Metrology AFM and Nanometrology

Journal:

Year:

2006

File:

PDF, 568 KB

2006

47

Prognostic impact of elevated preoperative C-reactive protein on patients with differentiated thyroid carcinoma

Shimura, Tatsuo, Shibata, Masahiko, Gonda, Kenji, Matsumoto, Yoshiko, Nakano, Keiichi, Iwadate, Manabu, Suzuki, Satoshi, Suzuki, Shinichi

Journal:

Journal of Surgical Research

Year:

2018

Language:

english

File:

PDF, 900 KB

english, 2018

48

Elevated serum galectin-3 is associated with poor prognosis in patients with colorectal carcinoma

Shimura, Tatsuo, Shibata, Masahiko, Gonda, Kenji, Nakajima, Takahiro, Chida, Shun, Noda, Masaru, Suzuki, Satoshi, Nakamura, Izumi, Ohki, Shinji, Takenoshita, Seiichi

Journal:

Annals of Cancer Research and Therapy

Year:

2016

Language:

english

File:

PDF, 553 KB

english, 2016

49

Linewidth calibration using a metrological atomic force microscope with a tip-tilting mechanism

Kizu, Ryosuke, Misumi, Ichiko, Hirai, Akiko, Kinoshita, Kazuto, Gonda, Satoshi

Journal:

Measurement Science and Technology

Year:

2018

Language:

english

File:

PDF, 1.95 MB

english, 2018

50

Extension of the range of profile surface roughness measurements using metrological atomic force microscope

Misumi, Ichiko, Sugawara, Kentaro, Kizu, Ryosuke, Hirai, Akiko, Gonda, Satoshi

Journal:

Precision Engineering

Year:

2019

Language:

english

File:

PDF, 2.66 MB

english, 2019